Cosmic-ray reliability of power semiconductors investigated at ISIS neutron source together with SME company SwissSEM and FHNW

The first week of May, our team together with SME company SwissSEM and University of Applied Sciences and Arts Northwestern Switzerland (FHNW) conducted a measurement campaign at the ChipIr beamline in ISIS neutron source. We have investigated the effects of cosmic-ray irradiation on the reliability of nanoscale oxide layers in power semiconductors. The results help SwissSEM to better understand the device failure related to cosmic neutrons and support development of more robust power semiconductors.